Teacher: Marialaura Tocci

Program: The Course will provide technical knowledge about characterization of materials using various microscopy and surface analysis techniques.

The main experimental techniques that will be described are: 

- scanning/transmission electron microscopy (SEM, STEM, TEM) and focused ion beam (FIB) microscopy: working principles, main differences, sample preparation, applications

- micro- and nanomechanical characterization: working principles, advantages, applications in-situ

Case studies and practical examples of applications for different materials will be described, interactive tasks will be carried out using a virtual microscope simulator. The aim is to provide tools to understand which experimental technique is adequate according to the material and the property of interest, which are the advantages but also which issues or limitations you should be aware of.

Finally, we will plan a lab visit to the Metallurgy labs. 

Durata (ore):  12

Lingua: English